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All INEL X-Ray diffractometers measure the entire 2θ diffraction angle pattern simultaneously by employing a unique curved X-Ray detector that replaces the older mechanical scanning goniometers used by other manufacturers. This makes INEL XRD systems perfect for kinetic or dynamic measurements in that all data are recorded in "real time", at very high resolution, with detector options capable of resolving 0.04 degrees-2θ FWHM. The systems are designed to analyze sample area as small as 10 microns.
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Inel, a specialist for over 35 years in the field of X-rays, can offer a wide range of diffraction sytems designed specifically for University, industrial and government laboratories.
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